Design for high temp.dynamic burn-in and TDBI of VLSI including DSP,FPGA,CPLD,CPU,etc.in various packages, while life test and high temp.dynamic burn-in screening for general D-signal IC.
1,128 channels of 20MHz bidirectional programmable D-signal,
2,Supporting of running DUT's I / O parallel port test, JTAC interface test and BIST test.
3,Having developed burn-in test code of TMS320C series' DSPs, Company Xilinx,Altera, and Lattice's full range of FPGA&CPLD device.
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